Plasma Enhanced Chemical Vapor Deposition

Plasma Enhanced Chemical Vapor Deposition

Plasma Enhanced Chemical Vapor Deposition

Description

Utilizes plasma to activate gaseous reactants to deposit uniform, dense and functional thin films on substrate surfaces in a low-temperature environment.

1.Plasma-activated reaction: Ionizes reactant gases via RF or microwave methods to generate highly reactive plasma, lowering the reaction activation energy and enabling thin film deposition at low temperatures.
2.Multi-type thin film preparation: Capable of depositing various thin films such as silicon oxide, silicon nitride, silicon oxynitride, and amorphous silicon to meet different functional requirements.
3.Precise process control: Accurately regulates reaction pressure, temperature, gas flow, and plasma power to achieve precise control over film thickness, composition, and density.
4.Uniformity assurance: Optimizes chamber structure and plasma distribution to ensure within-wafer and wafer-to-wafer film uniformity.

Parameter
  • Product DimensionsL11160mm*W2280mm*H4527mm
  • Uptime98%
  • Tube I.D480 mm / 540 mm
  • Capacity504 – 768 pcs/tube
  • Wafer Size18X – 230 mm
  • Film UniformityWithin-wafer & wafer-to-wafer ≤ 4%; run-to-run ≤ 3%
  • Flatzone350-600°C±1°C
  • Base Pressure≤1Pa
Highlights
  • System enables rapid cooling
  • Stable thermal and electric field uniformity
  • One-to-one boat transportation system for better stability and performance
  • Double layer water cooled flange improves sealing and O-ring lifetime
  • Maintenance-friendly: Quick assembly features for quartz tube and electrodes
  • Double boat system for more even power distribution and coating uniformity
PECVD Uniformity

PECVD Uniformity